Showing results: 46 - 60 of 68 items found.
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MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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RF Test Equipment -
Seibersdorf Labor GmbH
We calibrate following types of RF test equipment:EMF test systems (frequency selective)EMF test systems (broadband)Field strength transfer standards (e.g. RefRad)Line Impedance Stabilisation Network (LISN)Cable, attenuator, couplerAntennaField Probe
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9240 -
Boonton Electronics
The 9240 series is the latest addition to Boonton’s popular 9200 series of RF voltmeters. It combines accuracy, smart probes, and operator features that have never before been available in its price range. It is simple to use on the bench, and comprehensive enough to integrate into an ATE system.
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TYPE HFX-1 -
National RF, Inc
The Type HFX-1 Modulation Monitor is an ancillary piece of equipment, which is used with narrow bandwidth, or older oscilloscopes to allow viewing of RF signals and particularly modulated signals as high as 55MHz. The equipment contains an RF signal source and a broadband mixing circuit which converts the high frequency signal to an intermediate frequency within the oscilloscope’s range. The frequency control dial is simply adjusted until the RF signal is viewed on the scope. BNC connectors are mounted on the rear panel to allow interconnect to the scope and RF probe. This product was previously called "oscilloscope frequency extender" and may be used to view other high frequency signals on older or narrow band scopes.
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S-Probe -
PacketMicro Inc.
S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
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3440A -
Ballentine Laboratories, Inc.
The 3440A measures the true rms of low level RF and microwave signals to over 1GHz. High rms accuracy, traceable to NIST, is assured regardless of waveshape. Common calibration errors are eliminated through temperature compensation of the probe detector diodes; double shielding protects the interchangeable probes from rough handling and pickup. Relative gain or loss measurements are simplified by a 0 dB reference adjustment. DC output proportional to the ac input is provided for analog recorders and to allow operation as an ac-dc converter.
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PHD-3001A -
High Power Pulse Instruments GmbH
*Pulse force and pulse sense fixed pitch and flexible pitch RF probing solution for TLP/VF-TLP/HMM on-wafer measurements using Picoprobe™ Model 10*High peak current capability 80 A (100 ns)*DC – typ. 7 GHz bandwidth*Isolated probe-head ground shield for high pulse sense common mode signal rejection*Including fixed pitch replacement probe tip 50 Ω, right, 100 µm pad pitch*Including fixed pitch replacement probe tip 5 kΩ, left, 100 µm pad pitch*Including flexible pitch clamps plus 10-5k(0502)-125-W-1 and 10-50/30-125-W-1 replacement probe tips*True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment
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XF1 set -
Langer EMV-Technik GmbH
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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TS Series -
Micronor AG
Micronor now offers a complete range of fiber optic temperature sensors, probes and interfaces for temperature measurement in challenging environments. TS series fiber optic temperature probes offer immunity to RF and microwave radiation along with wide temperature range, intrinsic safety and non-invasive use. The fiber optic temperature probes can operate over -200°C to +300°C (-328°F to +572°C), and withstand harsh and corrosive environments. Typical fiber optic temperature monitoring applications include:
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Salicon Nano Technology
We are instrumental in offering quality range of nano technology products that find application in defense research and development organization. Our range encompasses probe station, microscope, extension cable, adopter and RF probing, and vibration isolation products. We have the ability and resources to design products in line with the exact specifications provided by the clients.
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3024 -
LBA Group, Inc
The COMM-connect 3024 RF Power Monitor from LBA Technology can control up to 8 external RF Measuring heads. The high dynamic range with external couplers and RF measuring heads cover from 1W to 1MW. The Power conversion algorithms handles multi carrier, multi mode, peak, average and RMS signals. The power readout is auto scaled and VSWR can be calculated between any probes. Also the measured and calculated results along with alarms can be shown in the local LCD. The instrument has SNMP support to allow network management. The instrument can be configured for VSWR and Power limits to give alarms. The alarms can be configured to operate relay drivers or isolated Optcouplers. The alarms can also be configured as SNMP traps sending relevant information to the network control center. The COMM-connect 3024 WEB enabled RF Power Monitor gives an unlimited number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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Teseq AG
The GTEM cell is a frequency extended variant of the traditional TEM (Transverse Electro-Magnetic) cell. The GTEM cell is, in principle, a tapered coaxial line (offset septum plate), which is terminated by a combination of discrete resistors and RF absorbers to achieve a broadband match. Designed for EMC applications, calibration of antennas/field probes, test and measuring of mobile phones and screening measuring of material.
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Fairview Microwave Inc.
Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
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RF6 set -
Langer EMV-Technik GmbH
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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EdgeProbe Advanced MultiStandard -
TestTree
The ideal tool for accurate & cost-effective monitoring probe for:DTV terrestrial transmission (DVB-T/T2, ISDB-T/Tb)DTV cable transmission (DVB-C/C2)DTV distribution over satellite (DVB-S/S2, T2-MI, OneBeam, MPTS)DTH uplink and reception (DVB-S/S2, MPTS)Digital Radio transmission (DAB/DAB+/T-DMB)Combine any two RF standards in one single 1RU device.Combined with a Network Monitoring System or not, the EdgeProbe Advanced provides a powerful broadcast network alert & diagnosis tool allowing Digital TV & Radio network operators to monitor global trends and anticipate potential failures.EdgeProbe Advanced is able to monitor the RF signal, through its RF inputs (up to 4 in 1RU), as well as the baseband transport before modulator, through its ASI and IP inputs.
